Our client is a global leader in semiconductor industry, including, but not limited to automotive, mobile, consumer electrics, smart home, smart city and communication infrastructure.

Producing tens of thousands of generic, multi-purpose components, with two-figure multiplier for conducted tests, the client needed centralized platform to manage all this data. We were faced with number of emerging problems to be solved:

• Expected search efficiency was very low,
• How to visualize aggregated data in a usable manner,
• How to compare multiple test passes efficiently,
• Specification and test limit ranges need to be customizable by the user.

Kick-off meetings with the client provided us with a solid foundation and valuable insight to establish specific goals to be reached during our collaboration:

1. Highly efficient test results aggregation system,
2. Centralized platform for multiple-source data management with high searchability of data and lowest possible resources cost,
3. User-friendly, easy access and search of pre-calculated test results

Highly efficient hardware intensive aggregation of test results was accomplished by creation of multi process parallel data funnels of large raw data sets. Simultaneously, enabling us to conduct result recalculation in a timely manner (500ms – 2000ms) after each user-initialized limit or condition (temperature, voltage) modification.